The X-ray Imaging division develops and evaluates non-destructive testing methods used to detect structures and defects measured at micrometre-scale or less. This is achieved with the use of ultra-high-resolution imaging X-ray methods as well as systems for the quantitative 3D characterisation of the material microstructure.

In this context, we offer expertise in complementary X-ray computed tomography (XCT) and X-ray scattering methods that serve the industrial and academic landscapes and are unique in the field. We develop new methods to expand non-destructive testing beyond traditional heavy-duty components to encompass miniaturised components made of lightweight materials. Material characterisation is a key topic, which drives the development of expertise and devices such as tensile/compression/torsion or high-temperature tests using XCT and refraction radiography.

We also analyse internal stresses using laboratory, high-energy X-ray (at synchrotrons) and neutron diffraction to investigate damage mechanisms in various materials.

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Prof. Dr./I. Giovanni Bruno, Head of Division Micro Non-Destructive Testing, Bundesanstalt für Materialforschung und -prüfung (BAM)

Contact Prof. Dr./I. Gio­van­ni Bruno

Head of X-ray Imaging

Phone +49 30 8104-1850