The Micro Non-Destructive Testing division develops and evaluates non-destructive testing methods used to detect structures and defects measured in micrometres or less. This is achieved with the use of ultra-high-resolution imaging X-ray methods as well as a quantitative system for the 3D characterisation of the material microstructure.

To this end, we offer particular expertise in computed tomography and X-ray scatter that industrial and academic environments support and make use of and which is unique in the field. By expanding non-destructive testing to encompass subjects ranging from traditional heavy-duty components to miniaturised components made of lightweight materials, we develop new methods (such as Talbot-Lau grating interferometry). Material characterisation is also the key word in relation to the development of expertise and apparatus for procedures such as tensile or high-temperature tests using CT and refraction apparatus.

We also investigate the use of neutron diffraction in tension analysis, which is used to examine damage mechanisms in different materials.

Prof. Dr./I. Giovanni Bruno, Head of Division Micro Non-Destructive Testing, Bundesanstalt für Materialforschung und -prüfung (BAM)

Contact Prof. Dr./I. Gio­van­ni Bruno

Head of Division 8.5

Unter den Eichen 87
12205 Berlin

Phone: +49 30 8104-1850

Email: Giovanni.Bruno@bam.de

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