- Performance of R&D projects
- Performance of standardisation projects
(DIN NA 062-08-16 AA, DIN NA 62-08-18 AA, ISO TC201, ISO TC202)
- Imaging failure analysis (e.g. on silicone contamination, delamination failure and other contamination problems)
- Advice and information on the use of analytical microanalysis and surface chemical analysis
ISO Definitions for Terms used in Surface Chemical Analysis and scanning-probe microscopy
The surface chemical analysis vocabulary developed under ISO TC 201 Surface Chemical Analysis provides the definitions for scientific terms in the two ISO International Standards:
ISO 18115-1: 2013(E) - Surface chemical analysis - Vocabulary - Part 1, General terms and terms used in spectroscopy
ISO 18115-2: 2013(E) - Surface chemical analysis - Vocabulary - Part 2, Terms used in scanning-probe microscopy
These Vocabularies are available from ISO (International Standards Organization in Geneva) or, for Germany, through DIN in German language.
The English definitions are freely available from ISO as PDFs at the ISO portal but also on the ISO Online Browsing Platform.
The Vocabularies ISO 18115-1, 18115–2 and the definitions available on the ISO Online Browsing Platform are copyright protected documents:
© ISO 2016
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below or ISO's member body in the country of the requester.
ISO Copyright Office
CP 401 • CH-1211 Geneva 20
Phone: + 41 22 749 01 11, Fax: + 41 22 749 09 47
Email: firstname.lastname@example.org, Website: www.iso.org
Permission has been granted by ISO for public access to ISO 18115-1 and ISO 18115-2 for educational and implementation purposes through seven approved websites at the National Physical Laboratory (UK), the American Vacuum Society (USA), the Environmental Molecular Sciences Laboratory (USA), the Surface Analysis Society of Japan (Japan), the National Institute of Advanced Industrial Science and Technology (Japan), the Bundesanstalt für Materialforschung und -prüfung (Germany) and the National Metrology Institute of Germany (Germany).