-
Home
-
-
Organisation
-
Organisation Chart
-
Materials Engineering
-
Materialography, Fractography and Ageing of Engineered Materials
Our industrialised society needs materials to construct buildings and production plants, for mechanical engineering, for transportation and communication technology, and for the generation of electricity and heat and the transport of these. The task of the Materialography, Fractography and Ageing of Engineered Materials division is to evaluate in materialographic terms semi-finished products and components made of metallic and ceramic materials, as well as composite materials that such components are made of.
This encompasses structural properties in volumes, changes to the surface caused by surrounding substances (corrosion, ageing), coatings, and an assessment of fracture surfaces (fractography) in the context of damage analysis. The analysis of structures, phases and layer systems is conducted using techniques ranging from optical methods, electron microscope analysis and transmission electron microscopy.
-
Fields of expertise
- Analysis of damage processes
- Metallographic structural evaluations
- Characterisation of nanocrystalline particles
- Characterisation of nanostructures
- Theory, practice and continued development of the electro backscatter diffraction method
- Evaluation of corrosion layers and their growth kinetics
- Identification of phases in phase mixtures
- Crystallography and orientation relationships in the structures of technical materials, layers and particles
- Discussions on thermodynamics of phase mixtures (heterogeneous balance)
- Interdisciplinary material investigations (crystallography, physics, material science, chemistry)
-
Main activities
- Qualitative and quantitative structural descriptions
- Electron beam analysis
- Materialography
- High-temperature corrosion
-
Range of services/technical equipment
- Metallography laboratory
- 2 scanning electron microscopes: Tescan Vega3 (EDX, EBSD) and LEO 1530 VP (EDX, EBSD)
- 2 focused ion beam, FEI FIB Quanta 3D FEG (DUAL BEAM) and FEI FIB Strata FIB200xP TMP with EDX
- STEM JEOL JEM 2200 FS transmission electron microscope
- Jeol JXA-8900-RL microprobe
- Seifert PTS goniometer with “low incidence”
- Corrosion test facilities (300°C ≤ T/°C ≤ 1100 °C ; p ≤ 300 bar; gas mixtures with up to five components and superimposition of mechanical load)
- Calculation of balance phases using FactSage 6.4
- Layer thickness measurement using Layers (GFal e.V.)
- Assessment of GJS using AMGuss (PixelFerber)
-
Publications of the division
