Reference measurement methods are becoming increasingly important in the EU in the context of the regulation of nanomaterials and advanced materials under REACH. BAM has many measurement methods at its disposal, which are continuously being further developed. The characterization of advanced materials currently focuses on morphology, size distribution, structure, specific surface area, chemical composition, and surface chemistry. Interdisciplinary sharing of instruments enables the use of a growing number of instruments and techniques. Currently, approximately 30 techniques are available at BAM. Graphic depiction: Advanced materials in the electron microscope Source: BAM
- Further activities in the field of nanoCharacterization include the
- Imaging techniques (AFM (IR-AFM, EC-AFM), μ-CT, electron microscopy (EM))
- Diffraction and scattering methods (SAXS/WAXS, XRD, DLS)
- Spectroscopic and chromatographic techniques (XPS, ToF-SIMS, ellipsometry, IR / Raman, ICP-MS, GC)
- Other methods (DSC (both flash DSC and normal DSC), aerosol measurement technology (DMAS/SMPSdevelopment of advanced analytical methods, correlative data analysis and collaborative development of measurement and sample databases for data management.
Further activities in the field of advanced characterization include the development of advanced, cross-scale analysis methods, correlative data analysis, sample preparation, automation of measurement data analysis, and collaborative development of measurement and sample databases for data management, adaptation of developed measurement methods from one material class to another, e.g., from nanoparticles to 2D graphene-related materials.