Start

02/10/2020 03:30 PM

End

02/10/2020 04:30 PM

Location

zoom online


see meeting join link below

Organized by

Bundesanstalt für Materialforschung und -prüfung and Diamond Light Source, UK

Live-webinar BAM and Diamond Light Source

Source: natasaadzic/iStock/Getty Images Plus

Please note the given time above is CEST (CEST = UTC + 2; BST = UTC + 1)

Topic

Effects of annealing and pressure on the Grazing Incidence X-ray Scatterings of Conjugated Polymer blends used in Organic Solar Cells

Presenter:

Dr Benjamin Agyei-Tuffour, University of Ghana, GH

Summary

This presentation shows the results of an experimental study of the effects of pressure and annealing on the conjugated polymer chain configurations in poly (3-hexylthiophene) and [6,6]-phenyl C61-butyric acid methyl ester (P3HT:PCBM) blends that are used in bulk heterojunction organic photovoltaic cells (OPVs). Annealing and the application of static loads on P3HT:PCBM blends on glass substrates were investigated. Microscopy and grazing incidence x-ray scattering techniques were adopted to analyze the surface morphologies, nano-/micro-structures and the chain configurations in the conjugated polymer blends. The OPV devices fabricated resulted in the I-V characteristics that have large dependence on the changes in the nano-/ micro-structures of the polymer blends. The pressure induced polymer chain configurations that were in the direction of the applied pressure (edge-on), led to a reduced lamellae spacing between the polymer units. This increased the crystallinity in the blend and played significant role in the organic solar cell performance. The findings of the study are discussed to influence the design and control of the nano-/micro-structures and the performance of bulk heterojunction organic solar cells.

Registration fee

These lectures are free and can be attended via Zoom by to up to 100 attendees.

The lectures will be recorded as well, and (with permission of the presenter) will be made available online afterwards for a broader educational reach.

To participate, use the meeting join link here.

For further questions, please contact scattering@bam.de.

Further Information