22/05/2020 04:30 PM
22/05/2020 05:30 PM
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Bundesanstalt für Materialforschung und -prüfung and Diamond Light Source, UK
X-ray Total Scattering: a tool for multi-length scale atomic characterisation
Dr Adam H. Clark from Paul Scherrer Institute, Switzerland
Time-resolved synchrotron X-ray total scattering gives access to the dynamic atomic structure during insitu and operando experiments providing access to multi-length scale information. Here the unusual redox properties of Ceria based catalysts are probed following the formation of an oxyhydride phase during the activation of hydrogen using X-ray total scattering and X-ray absorption spectroscopy.
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