12.11.2020 13:45 Uhr
13.11.2020 19:30 Uhr
see link below
Bundesanstalt für Materialforschung und -prüfung
The TOFCON is the 1st meeting focused on the ICP-ToFMS community. The main objective is to provide a platform for the exchange of experience among the users in open discussions on the technology and its application. Besides the presentation of current research results it is desired to discuss issues and ideas for new developments and application fields by means of ICP-ToF-MS.
All participants will be given the opportunity to present their work in the form of a talk. Topic could be amongst
others related to new insights regarding the theoretical background, practical experiences, method development,
and applications. Focus will be given to discussions between the participants and developers and TOFWERK representatives besides lectures. Participants are encouraged to present also “negative” results of their research efforts or share unresolved hypotheses with the audience for fruitful discussions.
Furthermore, it is planned during the 2nd day of the meeting a short hands-on course within the labs of the inorganic trace analysis division on the ICP-ToF-MS and a new and automated microdroplet sample introduction system via a virtual lab tour. This enables room for further discussions on technical aspects of ICP-ToF-MS as well as specific fields of application. In additon, if the purchase of such a device is planned in the future, this is the possibility to get a first look at the system and mode of action.
Please find the detailed programme here (PDF download).
Link for the participation will be send after the registration deadline.
Abstract submission deadline: October 12th, 2020
Registration deadline: October 31st, 2020