27.10.2020 13:00 Uhr
27.10.2020 18:00 Uhr
see registration below
VSL Dutch Metrology Institute, NL, and Bundesanstalt für Materialforschung und -prüfung (BAM)
The training course will focus on the challenges associated with the preparation, measurement and data analysis of nano particle reference materials within the framework of the European Metrology Programme for Innovation and Research (EMPIR) project nPSize. The metrology of SEM, TEM and AFM methods for particle imaging will be presented as well as a hybrid metrology approach, standardization and machine learning for advanced analysis of measurement data.
The training course will include lectures from key stakeholders and project partners including BAM, LNE, PTB, SMD, Pollen, NIMS and VSL and is targeted at PhD students, reference materials providers, analysis and accredited laboratories and instrument manufacturers.
R. Koops (VSL): Welcome to VSL and practicalities
D. Hodoroaba (BAM): The EMPIR project nPSize
L. Crouzier (LNE): Metrology of SEM measurements of nanoparticles
T. Klein (PTB): Metrology of TSEM measurements of nanoparticles
R. Koops (VSL): Metrology of AFM measurements of nanoparticles
C. Hörenz (BAM): Sample preparation for nanoparticle imaging
N. Feltin, D. Hodoroaba et al. (SMD/LNE/BAM): Hybrid methods for microscopy of nanoparticles (SEM/TSEM/AFM)
M. Bryan (POLLEN): Machine learning in nanoparticle metrology
T. Dziomba (PTB): Standardization
A. Schmidt (BAM): OECD projects on nanoparticle characterisation
A. van de Nes (VSL): In-situ nano particle metrology using traceable flow cytometry
Further information & registration
We hope you can join this free virtual training course and would be grateful if you can confirm your attendance before 23 October 2020 by submitting the registration form to Marion de Niet (firstname.lastname@example.org) so we can invite you to participate. Also, if you have any further questions please feel free to email.