Micro NDE

The Division develops and evaluates non-destructive testing methods (NDE) to detect microstructures and defects in the micrometer range and below. The objective of the systematic development, application and validation of those methods is to promote the use of NDE methods to safety engineering components and structures and to expand its application to microsystems.

Areas of competence

• Computed Tomography
• X-Ray Topography

Key activities

• Development, validation and standardization of tomographic method using of X-rays, gamma-rays and synchrotron radiation
• Development of three-dimensional measuring methods and reconstruction algorithms
• Non-destructive characterization of materials using X-ray-, texture-, refraction- and phase-topography
• Exploration of microstructures and failure analysis using computed tomography methods
• Development of reference materials and standards for the characterisation of computed tomography methods
• Accreditation, expert opinions, reference procedures

Test facilities and examination methods

• Facilities for tomographic analysis using X-ray, gamma-ray and synchrotron radiation in a broad energy band width from 5 keV to 12 MeV
• X-ray fine structure facilities for crystallographic raster topography
• Synchrotron radiation test station (the BAMline) for time and energy resolved materials characterization
• NDE specific image processing systems
• Two and three-dimensional reconstruction methods
• Computer-cluster for reconstruction software and image processing

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