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Reliability of Testing Systems

Calibration of measurement equipment

The calibration certificate confirms the traceability to the International System of Units (SI), reference standards and procedures based on common consent.

The competence of the working group and the achievable uncertainties of the quantities are shown in the following tables.

Calibration of force measuring devices

Quantity Testing range Testing conditions Relative uncertainty
Force* 0,01 N to 50 N Dead weight sets calibrated in N 5·10-4
Force* 10 N to 550 N Force reference standard facility 7·10-5
Force* 20 N to 2,2 kN Force reference standard facility 7·10-5 Tension; 1·10-4 Compression
Force* 2 kN to 200 kN Force reference standard facility 1·10-4
Force* 200 kN to 5 MN Force reference standard facility 2·10-4

* tension and compression

Calibration of electrical measuring instruments

mpty
Quantity Testing range Uncertainty
Direct voltage 1 µV to 20 mV 0,02% + 100 nV
Direct voltage 20 mV to 100 mV   8·10-6 + 1 µV
Direct voltage 100 mV   5·10-6
Direct voltage 100 mV to 1000 V 1·10-5
Direct voltage 1 V;10 V;100 V;1000 V 3·10-6
Direct voltage 0 to 30 kV 0,01
Direct current 0,5 pA to 100 nA   0,02 + 10 fA to  6·10-5 + 200 pA
Direct current 100 nA to 20 A 8·10-5  to  2,5·10-4
Direct current 20 A and more after inquiry  
Alternating voltage 0,2 mV to 1000 V; 10 Hz to 1 MHz 3·10-5  to  10-3
Alternating current 20 µA to 20 A; 10 Hz to 5 kHz 2·10-4  to  10-3
Ohmic resistance 0,1 mOhm to 100 TOhm 5·10-6  to  2·10-2 
Relative voltage ratio 0,05 mV/V to 10 mV/V; Carrier frequency 0 to 5 kHz 4·10-5  to  5·10-4mV/V
Capacity 1 pF; 10 pF; 100 pF; 1000 pF;10 nF; 100 nF; 1µF; 100 Hz  to  1 MHz 1·10-3 to 1·10-2
Charge, Q=C·U, U=0 to 10V 1 pF; 10 pF; 100 pF; 1000 pF; 10 nF; 100 nF; 1 µF; 100 Hz  to  10 kHz 0,01  
Time interval 10 ns to 10 s; 10 s to 10000 s 0,5 ns + 3·10-8 t  (t: time interval)
Frequency 1 mHz to 100 mHz 2·10-7 + Triggeruncertainty
Frequency 0,1 Hz to 3 GHz 1·10-9 + Triggeruncertainty at small frequencies
Damping 3 dB; 6 dB; 10 dB; 20 dB; 30 dB; 40 dB; 0 bis 500 MHz / coaxial 50 Ohm   0,3 dB to 0,5 dB  
Temperature -40 °C to 160 °C (Calibration of electrical quantities) 0,04 K to 0,1 K
Temperature -200 °C to 1800 °C (Calibration of electrical quantities) 0,01 K to 1 K
Air humidity, psychrometer-method 30 Pa to 1200 Pa; 15%RH to 95%RH; Air temperature 5 °C to 50 °C 2 Pa to 12 Pa; 0,8%RH to 2,5%RH

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2012-03-08  

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Measurement and Testing Technology; Sensors

     

Dr. rer. nat.
Andreas Subaric-Leitis
Unter den Eichen 87
12205 Berlin
phone:
+49 30 8104-3632
email:
Andreas.Subaric-Leitis@bam.de

Dipl.-Phys.
Wolfgang Gillwald
Unter den Eichen 87
12205 Berlin
phone:
+49 30 8104-4637
email:
Wolfgang.Gillwald@bam.de

Michael Fischer
 Unter den Eichen 87
12205 Berlin
phone:
+49 30 8104-3636
+49 30 8104-3635
email:
michael.fischer1@bam.de

Attestations of competence / accreditation

 

 

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