Inorganic Process Analytical Technology – X-ray Fluorescence Analysis
Sample change during X-ray fluorescence analysis
(full picture view)
X-ray fluorescence analysis (XRF) is a non-destructive method from material analytical technology, for the qualitative and quantitative determination of the elementary composition of a sample. Using stationary XRF, elements from boron to uranium in almost all solid and liquid matrices can be measured.
X-ray fluorescence analysis (XRF), mobile measurement of metals using the
handheld XRF
(full picture view)
The mobile X-ray fluorescence analyser is a versatile portable XRF device for the on-site elemental analysis in different matrices. It is used in the areas of quality assurance, testing for mixed-up components, PMI, recycling, environment, archaeometry, RoHS and chemistry.
Sample changer for a total reflection X-ray fluorescence analysis
(full picture view)
The TXRF is a highly sensitive analytical technology for elemental investigations in the picogram range – it is used for both general outline analyses and quantitative analyses of even the smallest sample quantities.
Irradiation at the BER II reactor at the Berlin Helmholtz Centre for
Material and Energy (HZB, Helmholtz-Zentrum Berlin für Materialien und Energie
GmbH) (full picture view)
© Helmholtz-Zentrum Berlin für Materialien und Energie GmbH
Neutron activation analysis is a highly sensitive, essentially non-destructive multi-element method which is very precise and accurate. It is used for the analysis of trace elements with very low limits of detection and for purity evaluations.
Neutron activation analysis is provided in close cooperation with the irradiation service at the BER II research reactor and the neutron activation analysis laboratory at the Berlin Helmholtz Centre for Material and Energy (HZB, Helmholtz-Zentrum Berlin für Materialien und Energie) in Berlin-Wannsee.
Division 1.4 | Inorganic Process Analytical Technology – X-ray Fluorescence Analysis
Dr. rer. nat.