Equipment and facilities

Total reflection X-ray fluorescence analysis (TXRF)

Sample changer for a total reflection X-ray fluorescence analysis

The TXRF is a highly sensitive analytical technology for elemental investigations in the picogram range – it is used for both general outline analyses and quantitative analyses of even the smallest sample quantities.

Technical Data

Instrument
FEI TXRF 8030C from Atomika

Matrices
Metals, plastics, mineral oil products, oxids, salt, ceramics, wood, soils, water (after mechanical or chemical sample preparation)

Sample condition
Measurement of the dissolved sample, or solid samples with plane surface and a diameter < 3 cm

Analytical range
Titanium to uranium

Ways of measurement
Screening, qualitative and (semi-)quantitative analysis of the elements

Limits of detection
In the picogram range for most elements

Further information
Sample preparation as e.g. sampling or dissolving the sample material can be carried out if required.

Division 1.4 | Inorganic Process Analytical Technology – X-ray Fluorescence Analysis | BAM Equipment and facilities

2012-01-26

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