Equipment and facilities

X-ray fluorescence analysis (XRF) - stationary

Sample change during X-ray fluorescence analysis

X-ray fluorescence analysis (XRF) is a non-destructive method from material analytical technology, for the qualitative and quantitative determination of the elementary composition of a sample. Using stationary XRF, elements from boron to uranium in almost all solid and liquid matrices can be measured.

Technical Data

Instrument
Sequential wavelength-dispersive MagiXPro X-ray spectrometer, Panalytical B.V.

Matrices
Metals, plastics, mineral oil products, oxids, salt, ceramics, wood, soils, water

Sample condition
Solid, in powder form, liquid

Analytical range
Boron to uranium

Ways of measurement
Qualitative and (semi-)quantitative analysis of the elements

Limit of detection
~10 µg/g for most elements with a max. precision of 0,04%-relative

Further information
Sample preparation as e.g. sampling, deep injections or glazing of the sample material can be carried out if required.

Division 1.4 | Inorganic Process Analytical Technology – X-ray Fluorescence Analysis | BAM Equipment and facilities

2012-01-26

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