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Reference procedures

Testing and chemical analysis

Catalogue of reference procedures provided by BAM

Chapter 8 - Testing of surface and layer properties

X-ray Photoelectron Spectroscopy for Chemical Analysis of Surfaces (ESCA / XPS): Measurement of Overlayer Thickness of Thermally Oxidized Silicon (PDF)
Spectroscopic Ellipsometry for Determination of Optical and Dielectric Material Constants and Thickness (PDF)
Quantitative Determination of Organic Silicon Compounds at the Surface of Elastomers (PDF)
Determination of Single Layer Thickness of Multilayer Coating Systems in the Micro- and Nanometer Range (PDF)
Instrumented Indentation Test for Determination of Hardness and Other Plastic-Elastic Materials Characteristics (PDF)
Multi-Probe Topography Analysis (PDF)

Catalogue of reference procedures

Reference Procedures | Expert Information

2010-10-25

Contact

Dr. rer. nat.
Martina Hedrich
Unter den Eichen 87
12205 Berlin
phone:
+49 30 8104-1941
email:
Martina.Hedrich@bam.de

Dipl.-Ing.
Arne Nymschefsky
Unter den Eichen 87
12205 Berlin
phone:
+49 30 8104-3773
email:
Arne.Nymschefsky@bam.de